Installed in 2026, the JEOL-JXA ISP100 Electron Probe Microanalyzer delivers outstanding spatial resolution and analytical precision, making it an ideal platform for high-quality quantitative analysis. Designed to measure all naturally occurring elements except H, He, and Li, this advanced instrument combines versatility with exceptional performance.
The system can be equipped with either a LaB6 cathode or a W electron source and features five wavelength-dispersive spectroscopy (WDS) detectors with large crystals to ensure exceptional precision and accuracy. An additional energy-dispersive spectroscopy (EDS) detector provides complementary analytical capability for a wide range of applications.
The instrument is operated using Probe for EPMA software, with remote access capabilities that support efficient operation, seamless connectivity, and collaboration with users worldwide.
TO PROBE OR NOT TO PROBE?
If you require any of the following, then the Electron Probe Microanalyzer is the instrument for you:
- Quantitative analyses with precision accuracy better than 0.1%.
- Analysis of light elements such as Boron, Carbon, Nitrogen, Oxygen, with sensitivity levels more than an order of magnitude higher than those available with Energy-Dispersive X-ray Spectroscopy (EDS) instruments.
- Resolution of severely overlapped spectrum peaks.
- Lower detection limits across the entire range of analyzable elements in the periodic table.
If you do not require any of the above capabilities, then one of the Scanning Electron Microscope may suffice for your needs.
