The upcoming JEOL-JXA ISP100 Electron Microprobe Analyzer boasts exceptional spatial resolution and analytical precision, ideal for quantitative analyses. Capable of measuring all naturally occurring elements—excluding H, He, and Li—with a detection limit as low as 10 ppm, this advanced instrument features a LaB6 cathode and W electron sources. It is equipped with five wavelength dispersive spectroscopy (WDS) detectors and large crystals for high precision and accuracy, along with one EDS detector. Additionally, the probe supports EPMA software and remote access, facilitating worldwide use and connectivity.
TO PROBE OR NOT TO PROBE?
If you require any of the following, then the Electron Probe Microanalyzer (EPMA) is the instrument for you:
- Quantitative analyses with precision accuracy better than 0.1%.
- Analysis of light elements such as Boron, Carbon, Nitrogen, Oxygen, with sensitivity levels more than an order of magnitude higher than those available with Energy-Dispersive X-ray Spectroscopy (EDS) instruments.
- Resolution of severely overlapped spectrum peaks.
- Lower detection limits (100 ppm) across the entire range of analyzable elements in the periodic table.
- Faster, more efficient elemental mapping of large and small areas.
If you do not require any of the above capabilities, then the Scanning Electron Microscope (SEM) may suffice for your needs.
