TESCAN Vega (4th generation) Scanning Electron Microscope (SEM)
Installed in 2023, the TESCAN Vega SEM provides high-resolution imaging and advanced analytical capabilities, making it an invaluable asset for research across all fields of science and materials, down to the micron scale.
- Operating Range:
- Accelerating Voltage: 0.5 kV to 30 kV
- Beam Current: 1 pA to 100 nA
- Magnification: 5x to 1,000,000x
- Detectors Available:
- Secondary Electron (SE)
- Backscattered Electron (BSE)
- Cathodoluminescence (CL)
- Ultim® Max 65 Energy-Dispersive X-ray Spectroscopy (EDS) from Oxford Instruments
Key Features
User-Friendly Software: Ensures accessibility for both experienced researchers and newcomers, optimizing ease of use.
High Resolution: Captures fine-grained structures at single-digit micron levels.
Large Area Mapping (LAM): Maps entire samples, with flexible detector selection based on sample needs.
Low Vacuum Mode:
Pressure range: 7 to 150 Pa
Gases available: Nitrogen (N₂) or Water Vapor (H₂O)
Ideal for non-conductive samples, minimizing charging without extensive preparation.
TESCAN Clara Scanning Electron Microscope (SEM)
Installed in 2023, the TESCAN Clara is a field emission SEM renowned for its ultra-high-resolution imaging and advanced analytical capabilities, making it an essential tool for research across all fields of science and materials, down to the nano scale.
- Operating Range:
- Accelerating Voltage: 0.5 kV to 30 kV
- Beam Current: 1 pA to 100 nA
- Magnification: 5x to 2,000,000x
- Detectors Available:
- Secondary Electron (SE)
- Backscattered Electron (BSE)
- Cathodoluminescence (CL)
- Scanning Transmission Electron Microscopy (STEM) detector, which allows for the imaging of Transmission Electron Microscopy (TEM) grids.
- Ultim® Max 100 Energy-Dispersive X-ray Spectroscopy (EDS) from Oxford Instruments
- Symmetry 3 Electron Backscatter Diffraction (EBSD) from Oxford Instruments
Key Features
User-Friendly Software: Designed to ensure accessibility for both seasoned researchers and newcomers, optimizing the use of the SEM’s powerful features.
Exceptional Resolution: Capable of imaging down to the single-digit nanometer scale, providing remarkable detail for fine grain structures and nanoscale features.
Large Area Mapping (LAM): Maps entire samples, with flexible detector selection based on sample needs, including STEM.
Low Vacuum Mode:
Pressure range: 7 to 500 Pa
Requires an aperture for operation
Gases available: Nitrogen (N₂) or Water Vapor (H₂O)
Ideal for biological and non-conductive samples, minimizing charging effects without extensive preparation.
Our lab utilizes the latest version of the Oxford Instruments AZtec software with both the TESCAN Vega and TESCAN Clara SEMs for advanced Energy-Dispersive X-ray Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) analysis. The AZtec software offers powerful analytical capabilities, including accurate elemental mapping and crystallographic orientation determination, with an intuitive interface that enhances user experience and productivity. This cutting-edge software ensures precise, reliable results, making it an invaluable tool for our research applications.
